Super-Sharp option for Quad Tech probes provides an increase in test cell throughput and maintains fidelity of test signal over longer uninterrupted run times for higher yields.

Increases sharpness of probe tip, while making probe tip surface smoother. Advantages include increased run times between contactor cleaning, increased probe life, increased yield, and reduced system downtime for contactor maintenance. Cleaner piercing of surface oxides improves interconnect quality of the probe to the device under test. Reportedly provides improved repeatability of contact resistance over longer uninterrupted run times for increased cycle counts and yield between cleaning. Smooth surface reportedly does not fill with solder as quickly as surfaces of traditional probes. Is available for Mercury, Gemini, Kelvin, and Atlas systems.



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