SANTA CLARA, CAAgilent Technologies is offering a free three-part series of application notes on signal integrity analysis.
Part 1 covers time domain reflectometry (TDR); Part 2 covers 4-port TDR using vector network analyzers (VNAs) and physical layer test system (PLTS); Part 3 covers de-embedding.
These notes are tools for creating topology models, S parameter behavioral models, characterization of rise time degradation, interconnect bandwidth, near- and far-end cross talk, odd mode, even mode, differential and common impedance, mode conversion and complete differential channel characterization.
Download free copies at or         

Submit to FacebookSubmit to Google PlusSubmit to TwitterSubmit to LinkedInPrint Article