M2 Blizzard is a small-spot X-ray fluorescence (XRF) spectrometer designed for nondestructive analysis of printed circuit boards, in accordance with ASTM B568 and DIN/ISO 3497 standards. Uses XSpect Pro and XData software, it enables characterization of metal multilayer systems, consisting of up to 12 layers with up to 25 elements each. Slotted sample chamber and large tray support precise positioning of all types of PCBs. Comes with a high-performance silicon drift detector suitable for analysis of thinner layers and unknowns, as well as for routine analysis. Comes with video microscope system with auto-focus. Has pass/fail determination or trend line display with upper and lower control limits. Reporting and data archiving functions are included, as well as data export to Excel. Optional foot switch and touchscreen operation.

Bruker, www.bruker.com

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