Agilent Technologies Inc. has released a limited access solution for In-Circuit Test (ICT) users that reportedly eliminates the need for physical test points. According to the company, Cover-Extend is part of the VTEP v2.0 powered test suite, and is a hybrid between the Boundary Scan test and VTEP Vectorless Test methodologies used in electronic manufacturing.

Cover-Extend uses stimulus provided by boundary scan cells, which do not require physical test points. The benefits include claimed improved test coverage, savings on fixturing operating cost, and strain relief on solder joints, resulting from fewer test probes needed underneath high-density ICs (e.g., BGAs).
 
"Cover-Extend addresses key concerns in today's manufacturing environment - cost, coverage, quality and speed," said Daniel Mak, VP and GM of Agilent's Measurement Systems Division. "The results we are getting from our customers' lines are very positive, and we will implement Cover-Extend in full-scale production environments…in April."

Agilent will conduct live demonstrations of Cover-Extend at two major test and inspection tradeshows: Apex 2008, April 1-3 in Las Vegas, NV, and Nepcon Shanghai 2008, April 8-11, Shanghai, China.

www.agilent.com

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