FT230 XRF analyzer is designed to enable quality control by simplifying and accelerating testing of components and assemblies.

Speeds up analysis to help electronics and component-level manufacturers, general metal finishers and plating-on-plastic facilities achieve 100% inspection and meet tightening specifications. Designed to reduce amount of time to complete XRF measurement. Includes intelligent part recognition feature Find My Part; automatically selects features that need to be measured, analytical routines and reporting rules. On-board, user-built library handles new parts and routines as work changes. Runs on FT Connect software, with aspects of SmartLink and X-ray Station software. FT Connect focuses the interface on most important aspects of XRF. Results are displayed on main measurement screen. Results can be exported in spreadsheet or JSON format for integration with SCADA, QMS, MES or ERP systems. Customized reports can be created for internal or external customers. Has functions to confirm instrument stability, including routine instrument checks and calibration validation tools. On-board diagnostics provide information about health of instrument. Data can be shared with technical support team over ExTOPE Connect. High-res SDD screens parts for conformity to restricted materials legislations such as RoHS and analyzes composition of materials, including plating bath solutions and metal alloys, useful for validating incoming substrates and confirming chemistry.

Hitachi High-Tech Analytical Science
hitachi-hightech.com/hha

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