CR-8000 now comes with a design for test (DFT) capability to improve test coverage during schematic entry.

Capability is based on XJTAG’s DFT Assistant, and will be available as a free plugin for CR-8000 Design Gateway users. Will help validate correct JTAG chain connectivity while displaying boundary scan access and coverage onto the schematic diagram through full integration with CR-8000 Design Gateway. Is said to make it easy to see test access as design evolves, allowing optimization of testing before PCBs are produced.

Zuken

zuken.com/en/news/press-releases/2017/07-xjtag

Register now for PCB West the Silicon Valley's largest PCB industry trade show: pcbwest.com!

Submit to FacebookSubmit to Google PlusSubmit to TwitterSubmit to LinkedInPrint Article