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National Instruments Names Test and Measurement Trends

Published: 14 January 2009
 by Staff
AUSTIN, TX – National Instruments (NI) has named three trends that it believes will improve the efficiency of test and measurement systems in 2009.

Software-defined instrumentation, parallel processing technologies and new methods for wireless and semiconductor testing will enable engineers to develop faster and more flexible automated test systems while reducing costs.
 
Companies that have used these methods and technologies are reporting significant benefits. The most significant of the three trends is the adoption of software-defined instrumentation, or virtual instruments.
 
Mainstream adoption of software-defined instrumentation has climbed due to the quick return on investment; new levels of measurement performance have been realized through software-defined instrumentation. In addition, multicore processing, field-programmable gate arrays and other technological advancements have reduced test costs.
 
“The challenging world economy is forcing more companies to look at alternatives to their existing test engineering strategies,” said Eric Starkloff, vice president of product marketing for test and measurement at National Instruments. “More engineers than ever before are turning to software-defined instrumentation and the latest commercial technologies to achieve significant performance and flexibility gains while reducing their overall cost of test.”
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