JTAG Technologies has introduced the JT 37x7/RMI, a rack mount instrument that combines a boundary-scan controller and a 256 channel I/O tester in a compact 1U x 19" enclosure. The company claims the product incorporates the capability of their 'DataBlaster' boundary-scan controller with PCB testing plus flash, PLD device in-system programming, and the company's Digital I/O Scan (DIOS) technology.

The RMI can interface to a computer through one of three standard formats; USB 2.0, Ethernet 10/100 and IEEE 1394 Firewire. Test clock frequency is programmable up to 40 MHz, and TAP voltages can be set for a range of input and output characteristics.

Input and output voltage thresholds can be programmed to 1.5, 1.8, 2.5 or 3.3V allowing the testing of modern low-voltage logic families. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals, and are grouped into blocks of 16. Any of the 16-channel groups can be bypassed, and selected channels can be interfaced with custom cabling to the UUT (low volume apps) or interfaced with bed-of-nails fixtures for efficiency and higher volume production.

The company claims that the product is fully compatible with existing JTAG tools and works with other industry standards, including National Instruments' LabVIEW, LabWindows and TestStand as well as custom C or C++ and Visual Basic test systems.