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Innov-X Rolls Out Hawk Micro XRF Benchtop Analyzers

Published: 17 April 2007
WOBURN, MA -- Innov-x Systems' Hawk Micro XRF benchtop analyzers deliver identification and elemental analysis from Ch to U. It uses collimated beam of 13 to 0.2 mm diameter, with laser beam focusing. The analyzers are said to be ideal for testing small or nonhomogeneous samples.

Applications include RoHS compliance analysis for electronics, PCB and components. They can reportedly perform standard-less quantitative analysis with statistical accuracy. Movable X-Y stage affords precise measurements across samples. A color CCD camera enables digital snapshots with magnification of up to 68X; combined with the laser spot tool, enables digital pictures to be analyzed and stored. Includes a large testing chamber, X-ray tube source and Si PiN-diode detector interfaced to a PC. 
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