Toronto, May 30, 2022 (GLOBE NEWSWIRE) — Firan Technology Group Corporation (TSX: FTG) today recertifies IPC’s verification services program as IPC-1791, Trusted Electronics Fabricator Requirements Qualified Manufacturers Listing (QML) Circuits Fredericksburg, VA.
Chicago: Prashant Patel, owner and president of Alpha Circuit I LLC in Elmhurst, Illinois announced that his company has purchased a new Schmoll MXY 2 Drill as part of the complete revitalization of his company.
BRUSSELS, Belgium ─ May 30, 2022 ─ SEMI Europe, the industry association that unites the entire electronics manufacturing and design supply chain in Europe, today urged swift adoption of the European Chips Act and invited discussions on the legislation with the European Parliament, Member States and the European Commission. The Act aims to strengthen Europe’s competitiveness and resilience in semiconductor technologies and applications while enabling the region’s digital and green transition.
Foundation to develop semiconductor job training in Michigan under SEMI Career and Apprenticeship Network (SCAN) program
In the course of its modernisation offensive, the Hanover-based (Germany) PCB manufacturer ILFA relies on the experience of the Schmoll Machine Group. From June 2022, the first 16 LHMT handling devices of the type RobiFlex 2x1 will be delivered and successively integrated into production. This will automate a large number of activities that were previously carried out manually. ILFA is currently investing massively in machinery, equipment and personnel, with automation being an essential part of the modernisation offensive.
BANNOCKBURN, Ill., USA, May 24, 2022 — From battery fires to non-functional charging stations, from dendrites to poor cable connections, electronic system failures have caused massive recalls. Failures are increasing significantly, not because of quality, but because of usage and implementation of technology. As the expected lifetime usage of parts increases and technology applications change, materials, approaches, and test parameters must change as well.