SANTA CLARA, CA – Agilent Technologies is offering a free three-part series of application notes on signal integrity analysis.

Part 1 covers time domain reflectometry (TDR); Part 2 covers 4-port TDR using vector network analyzers (VNAs) and physical layer test system (PLTS); Part 3 covers de-embedding.

These notes are tools for creating topology models, S parameter behavioral models, characterization of rise time degradation, interconnect bandwidth, near- and far-end cross talk, odd mode, even mode, differential and common impedance, mode conversion and complete differential channel characterization.

Download free copies at www.agilent.com/find/plts or www.agilent.com/find/multiport.