BOSTON – National Instruments will host a free one-day technical conference on test, measurement and embedded applications in Boston next month.

NIDays will focus on innovations in RF and condition monitoring applications. The Nov. 4 event includes two keynotes, including one by entrepreneur and researcher Jonathan Rothberg; more than 30 technical sessions; hands-on workshops, and an exhibition.

For more information and to register, visit www.ni.com/nidays-boston.