ScanExpress version 7.7 boundary scan tool suite includes improved constraints handling, support for multi-core devices, and new JTAG Embedded Test support for additional Freescale and Texas Instruments processors.

Software improvements include: Separate global and local constraint entry within the ScanExpress TPG preparation GUI; inverted transparency model support along with a new constraint to identify inverted nets; ability to associate multiple BSDL files to a single JTAG device; NAND Flash bad block management support in ScanExpress JET; optimization of STAPL file execution for improved throughput.

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