Log in / Register
  • Thermal Vias are Ineffective. Here’s Why.

    Thermal Vias are Ineffective. Here’s Why.

    Adding thermal vias can take up valuable board space with little benefit.
      READ MORE...

  • Connecting the Industry, from Boards to Assemblies

    Connecting the Industry, from Boards to Assemblies

    HDP is embarking on new rounds of evaluations of laminates and lead-free solders.
      READ MORE...

  • Exploring the Impact of AI

    Exploring the Impact of AI

    A special panel discusses the growth of AI tools and its possible effects on the industry.
      READ MORE...

  • A Journey in Rigid-Flex Design

    A Journey in Rigid-Flex Design

    Overcoming the challenges of rigid-flex designs can be incredibly rewarding.
      READ MORE...

  • Creating the Ultra Library

    Creating the Ultra Library

    Building and maintaining what's said to be the world's largest CAD database requires strong relationships.
      READ MORE...

Homepage Slideshow

Bruker Introduces M2 Blizzard XRF Spectrometer

Published: 17 March 2015

M2 Blizzard is a small-spot X-ray fluorescence (XRF) spectrometer designed for nondestructive analysis of printed circuit boards, in accordance with ASTM B568 and DIN/ISO 3497 standards. Uses XSpect Pro and XData software, it enables characterization of metal multilayer systems, consisting of up to 12 layers with up to 25 elements each. Slotted sample chamber and large tray support precise positioning of all types of PCBs. Comes with a high-performance silicon drift detector suitable for analysis of thinner layers and unknowns, as well as for routine analysis. Comes with video microscope system with auto-focus. Has pass/fail determination or trend line display with upper and lower control limits. Reporting and data archiving functions are included, as well as data export to Excel. Optional foot switch and touchscreen operation.

Bruker, www.bruker.com

 

Submit to FacebookSubmit to Google PlusSubmit to TwitterSubmit to LinkedInPrint Article