Leica Launches DCM8 3D Surface Metrology Print E-mail
Written by Chelsey Drysdale   
Thursday, 13 February 2014 17:59

Leica DCM8 combined confocal and interferometric optical profiler is for nondestructive 3D surface profiling. Provides high-def confocal microscopy for high lateral resolution and interferometry to reach sub-nm vertical resolution. Provides lateral resolution up to 140nm and vertical resolution of up to 0.1nm. Employs confocal scanning technology without moving parts in the sensor head. Includes four LED light sources: blue (460nm), green (530nm), red (630nm), and white (centered 550nm); has an integrated CCD camera with XY topography-stitching mode.

Leica Microsystems, www.leica-microsystems.com/dcm8

 

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