| iNEMI Roadmap Workshop for Critical Electronics Technologies |
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| Written by Philip Buonpastore | |||
| Wednesday, 30 April 2008 16:09 | |||
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HERNDON, VA – The North American workshop for the 2009 iNEMI Roadmap will review drafts of the majority of the 22 technology and business process chapters included in the roadmap. The full-day meeting, scheduled for May 14 at iNEMI’s Herndon headquarters, provides committees with a “sneak peek” at work in progress, and workshop participants can provide feedback and direction to ensure that the final chapters accurately reflect the state of the industry and anticipate future directions. “Many of the other industry roadmaps focus on one particular segment or technology area, such as semiconductors or substrates. The iNEMI Roadmap takes a system approach and covers the many technologies and infrastructure areas required for electronics manufacturing,” said Chuck Richardson of iNEMI. Topics to be covered in the North American workshop include business processes and technologies, such as information management, design technologies, manufacturing technologies, inspection and measurement, and component and subsystem technologies. New topics to be covered in the 2009 Roadmap include photovoltaics and solid state illumination, both of which are scheduled for discussion at the workshop. Registration deadline is May 8. For additional information about or to register for the workshop, go to: inemi.org/cms/calendar/2009_RM_NA_May08.html
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Ansoft Designer 6.0 Solver on Demand technology analyzes signal-integrity, power-integrity and electromagnetic interference problems from a single schematic- and layout-based environment. Can access field and circuit simulation tools while designing electronic packages and PCBs early in the design cycle. Integrates HFSS 3-D electromagnetic field simulation software and HSPICE IC simulation. Can predict how high-frequency electromagnetic components affect ICs. Provides user interface to HSPICE with direct links to HFSS and access to the ANSYS QuickEye and VerifEye convolution and statistical...
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