CSZ Adds HALT, HASS Services | Print |  E-mail
Written by Mike Buetow   
Friday, 24 August 2012 13:48

CINCINNATI, OH – Cincinnati Sub-Zero has added a pair of accelerated testing methods to its lineup of services.

CSZ has added HALT (Highly Accelerated Life Testing) and HASS (Highly Accelerated Stress Screening) testing to help shorten new product development time, decrease production and warranty costs, and improve reliability.

These accelerated test methods employ stresses significantly higher than field environments to uncover design and process weaknesses.

"HALT testing is primarily used during the product design phase to reveal any defects and make the product more rugged and reliable. HASS testing is principally used to screen for manufacturing defects by stressing the product without causing damage or a significant reduction of the product's expected lifespan," said Glenn Kruschinski, test lab director.

"The most commonly-tested products include printed circuit boards, power supplies, medical products, monitors/displays, avionics, gears, transmissions, and GPS systems," he said.


blog comments powered by Disqus
 

Search

Search

Login

CB Login

Language

Language

English French German Italian Portuguese Russian Spanish
 
Printed Circuit Design & Fab Magazine on Facebook