| Multisim and LabVIEW Improved |
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| Monday, 06 October 2008 13:22 | |||
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AUSTIN, TX– National Instruments announces further integration of its Multisim and LabVIEW platforms. The platforms allow engineers to identify and analyze design efficiency. Errors can be detected at an earlier stage of the design process, and circuit design is better enhanced. Multisim allows circuit schematics to be built interactively, as well as simulates circuit behavior in a graphical environment. The platform abstracts the complexity of SPICE simulation and achieves a faster prototype turnaround, bridging the gap between design and test. LabVIEW allows engineers to increase their productivity in circuit design in a cost-efficient and timely manner. The platform provides rapid connectivity simulation and real-world measurements.
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Products
ANSYS Releases Ansoft Designer 6.0
Ansoft Designer 6.0 Solver on Demand technology analyzes signal-integrity, power-integrity and electromagnetic interference problems from a single schematic- and layout-based environment. Can access field and circuit simulation tools while designing electronic packages and PCBs early in the design cycle. Integrates HFSS 3-D electromagnetic field simulation software and HSPICE IC simulation. Can predict how high-frequency electromagnetic components affect ICs. Provides user interface to HSPICE with direct links to HFSS and access to the ANSYS QuickEye and VerifEye convolution and statistical...
Ansoft Designer 6.0 Solver on Demand technology analyzes signal-integrity, power-integrity and electromagnetic interference problems from a single schematic- and layout-based environment. Can access field and circuit simulation tools while designing electronic packages and PCBs early in the design cycle. Integrates HFSS 3-D electromagnetic field simulation software and HSPICE IC simulation. Can predict how high-frequency electromagnetic components affect ICs. Provides user interface to HSPICE with direct links to HFSS and access to the ANSYS QuickEye and VerifEye convolution and statistical...
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