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Agilent Announces SI Analysis Application Notes |
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Written by Administrator
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Tuesday, 24 July 2007 |
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SANTA CLARA, CA – Agilent Technologies is offering a free three-part series of application notes on signal integrity analysis.
Part 1 covers time domain reflectometry (TDR); Part 2 covers 4-port TDR using vector network analyzers (VNAs) and physical layer test system (PLTS); Part 3 covers de-embedding.
These notes are tools for creating topology models, S parameter behavioral models, characterization of rise time degradation, interconnect bandwidth, near- and far-end cross talk, odd mode, even mode, differential and common impedance, mode conversion and complete differential channel characterization.
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