| Corelis Releases ScanExpress v. 7.7 Boundary Scan Suite |
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| Written by Mike Buetow | |||
| Tuesday, 22 May 2012 15:18 | |||
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ScanExpress version 7.7 boundary scan tool suite includes improved constraints handling, support for multi-core devices, and new JTAG Embedded Test support for additional Freescale and Texas Instruments processors. Software improvements include: Separate global and local constraint entry within the ScanExpress TPG preparation GUI; inverted transparency model support along with a new constraint to identify inverted nets; ability to associate multiple BSDL files to a single JTAG device; NAND Flash bad block management support in ScanExpress JET; optimization of STAPL file execution for improved throughput.
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| Last Updated on Tuesday, 22 May 2012 15:31 |
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